AREAS
The Materials Characterization Laboratory is focused on the chemical, structural and morphological characterization of materials and components, studying its evolution and degradation.
At the laboratory the analysis, characterization and quality control of materials and components are carried out before and after their useful life.
EQUIPMENT
THERMOGRAVIMETRIC ANALYZER (TGA-DSC)
- Temperature range: ambient to 1500 ºC.
- Balance sensitivity 0.1 µg.
- Calorimetric Accuracy/Precision: ± 2%.
- Reactive gas capability.
INFRARED SPECTROMETER (ATR-FTIR)
- MID-IR spectral range 9,000-350 cm-1.
- ATR technique: diamond crystal and ZnSe lenses.
- Detectors: DLaTGS y MCT.
- Spectral resolution: -1.
- Interface FTIR-TGA.
PHYSISORPTION AND CHEMISORPTION ANALYZER
- Mesopore to micropore range.
- Static and dynamic chemisorption (TPR, TPO, TPD).
- Transducers: 1000, 10 y 0.1 torr.
- Dedicated transducer P0.
- Furnace: ambient to 1100 ºC.
INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION (ICP-OES)
- Synchronous Vertical Dual View technology.
- Typically stable to less than 1% RSD over 8 hours without internal standardization or any form of drift correction.
- Optical resolution
- CCD detector.
SCANNING ELECTRON MICROSCOPE (SEM-EDS)
- Resolution: 4.0 nm at 20 kV.
- Magnification: x5 to x300,000.
- Detectors: secondary electron, backscattered electron and X-rays.
- Accelerating voltage: 0.5-20 kV.
- Maximum specimen: 150 mm diameter.
- Pressure in low vacuum mode.
OPTICAL PROFILOMETER
- Maximum sample area: 50mm x 50mm.
- Lateral resolution: 1.6 μm.
- Reflective and non reflective materials analysis.
- 3D software.
SERVICES
- Simultaneous Thermal Analysis TGA-DSC.
- Combined TGA-DSC/FTIR analysis.
- Scanning Electron Microscopy (SEM-EDX): morfology and composition.
- Sample preparation for SEM: cutting and polishing.
- Sample coating: gold/carbon.
- Optical Microscopy, image analysis.
- FTIR-ATR analysis.
- Semiquantitative multielemental analysis.
- Quantitative elemental analysis.
- Microwave digestion.
- Adsorption-desorption isotherms.
- Nitrogen adsorption: specific surface area, BET area.
- Chemisorption analysis (H2, CO).
- Temperature programmed analysis (TPR, TPO, and TPD).
- Surface’s roughness analysis.
PhD. Margarita Sánchez Molina
Materials Characterization Laboratory Manager
Phone: +34 926 420 682 – Ext. 134
Mail: margarita.sanchez@cnh2.es
LEAFLET
Materials Characterization Laboratory Leaflet
